{
  "schema_version": "1.4.0",
  "id": "GHSA-h94r-w24g-cp37",
  "modified": "2022-05-14T01:57:01Z",
  "published": "2022-05-14T01:57:01Z",
  "aliases": [
    "CVE-2018-11982"
  ],
  "details": "In Snapdragon (Mobile, Wear) in version MDM9206, MDM9607, MDM9635M, MDM9640, MDM9645, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 450, SD 615/16/SD 415, SD 617, SD 625, SD 650/52, SD 810, SD 820, SD 835, Snapdragon_High_Med_2016, a double free of ASN1 heap memory used for EUTRA CAP container occurs during UTRAN to LTE Capability inquiry procedure.",
  "severity": [
    {
      "type": "CVSS_V3",
      "score": "CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H"
    }
  ],
  "affected": [],
  "references": [
    {
      "type": "ADVISORY",
      "url": "https://nvd.nist.gov/vuln/detail/CVE-2018-11982"
    },
    {
      "type": "WEB",
      "url": "https://www.qualcomm.com/company/product-security/bulletins"
    }
  ],
  "database_specific": {
    "cwe_ids": [
      "CWE-415"
    ],
    "severity": "HIGH",
    "github_reviewed": false,
    "github_reviewed_at": null,
    "nvd_published_at": "2018-09-20T13:29:00Z"
  }
}