{
  "schema_version": "1.4.0",
  "id": "GHSA-35f3-6m6g-7f92",
  "modified": "2022-09-21T00:00:47Z",
  "published": "2022-09-17T00:00:40Z",
  "aliases": [
    "CVE-2022-25696"
  ],
  "details": "Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables",
  "severity": [
    {
      "type": "CVSS_V3",
      "score": "CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:H"
    }
  ],
  "affected": [],
  "references": [
    {
      "type": "ADVISORY",
      "url": "https://nvd.nist.gov/vuln/detail/CVE-2022-25696"
    },
    {
      "type": "WEB",
      "url": "https://www.qualcomm.com/company/product-security/bulletins/september-2022-bulletin"
    }
  ],
  "database_specific": {
    "cwe_ids": [
      "CWE-367"
    ],
    "severity": "HIGH",
    "github_reviewed": false,
    "github_reviewed_at": null,
    "nvd_published_at": "2022-09-16T06:15:00Z"
  }
}